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 HEF4094B
8-stage shift-and-store bus register
Rev. 04 -- 30 October 2008 Product data sheet
1. General description
The HEF4094B is an 8-stage serial shift register. It has a storage latch associated with each stage for strobing data from the serial input to parallel buffered 3-state outputs QP0 to QP7. The parallel outputs may be connected directly to common bus lines. Data is shifted on positive-going clock transitions. The data in each shift register stage is transferred to the storage register when the strobe (STR) input is HIGH. Data in the storage register appears at the outputs whenever the output enable (OE) signal is HIGH. Two serial outputs (QS1 and QS2) are available for cascading a number of HEF4094B devices. Serial data is available at QS1 on positive-going clock edges to allow high-speed operation in cascaded systems with a fast clock rise time. The same serial data is available at QS2 on the next negative going clock edge. This is used for cascading HEF4094B devices when the clock has a slow rise time. It operates over a recommended VDD power supply range of 3 V to 15 V referenced to VSS (usually ground). Unused inputs must be connected to VDD, VSS, or another input. It is also suitable for use over the industrial (-40 C to +85 C) and automotive (-40 C to +125 C) temperature ranges.
2. Features
I I I I I I Fully static operation 5 V, 10 V, and 15 V parametric ratings Standardized symmetrical output characteristics Operates across the automotive temperature range -40 C to +125 C Complies with JEDEC standard JESD 13-B ESD protection: N HBM JESD22-A114E exceeds 2000 V N MM JESD22-A115-A exceeds 200 V
3. Ordering information
Table 1. Ordering information All types operate from -40 C to +125 C. Type number HEF4094BP HEF4094BT HEF4094BTS Package Name DIP16 SO16 SSOP16 Description plastic dual in-line package; 16-leads (300 mil) plastic small outline package; 16 leads; body width 3.9 mm plastic shrink small outline package; 16 leads; body width 5.3 mm Version SOT38-4 SOT109-1 SOT338-1
NXP Semiconductors
HEF4094B
8-stage shift-and-store bus register
4. Functional diagram
3 CP 1 STR QS1 QS2 2 3 D CP 8-STAGE SHIFT REGISTER QS2 QS1 STR 8-BIT STORAGE REGISTER 10 9 2 D QP3 1 QP4 QP5 15 OE QP6 3-STATE OUTPUTS QP0 QP1 QP2 QP3 QP4 QP5 QP6 QP7 4 5 6 7 14 13 12 11
001aaf119
9 10 4 5 6 7 14 13 12 11
QP0 QP1 QP2
QP7 OE 15
001aaf111
Fig 1.
Functional diagram
Fig 2.
Logic symbol
STAGE 0 D D CP FF 0 CP CP Q D
STAGES 1 TO 6 Q
STAGE 7 D CP FF 7 D CP LATCH Q QS2 Q QS1
D CP
Q
D CP
Q
LATCH 0 STR
LATCH 7
OE
QP0 QP1
QP2 QP3
QP4 QP5
QP6 QP7
001aag799
Fig 3.
Logic diagram
HEF4094B_4
(c) NXP B.V. 2008. All rights reserved.
Product data sheet
Rev. 04 -- 30 October 2008
2 of 17
NXP Semiconductors
HEF4094B
8-stage shift-and-store bus register
5. Pinning information
5.1 Pinning
HEF4094B
STR D CP QP0 QP1 QP2 QP3 VSS 1 2 3 4 5 6 7 8
001aae662
16 VDD 15 OE 14 QP4 13 QP5 12 QP6 11 QP7 10 QS2 9 QS1
Fig 4.
Pin configuration
5.2 Pin description
Table 2. Symbol STR D CP QP0 to QP7 VSS QS1 QS2 OE VDD Pin description Pin 1 2 3 4, 5, 6, 7, 14, 13, 12, 11 8 9 10 15 16 Description strobe input data input clock input parallel output ground supply voltage serial output serial output output enable input supply voltage
6. Functional description
Table 3. Inputs CP OE L L H H H STR X X L H H D X X X L H Function table[1] Parallel outputs QP0 Z Z NC L H QPn Z Z NC QPn -1 QPn -1 Serial outputs QS1 Q6S NC QS6 QS6 QS6 QS2 NC Q7S NC NC NC
HEF4094B_4
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Product data sheet
Rev. 04 -- 30 October 2008
3 of 17
NXP Semiconductors
HEF4094B
8-stage shift-and-store bus register
Table 3. Inputs CP
[1]
Function table[1] ...continued Parallel outputs OE H STR H D H QP0 NC QPn NC Serial outputs QS1 NC QS2 Q7S
At the positive clock edge, the information in the 7th register stage is transferred to the 8th register stage and the QSn outputs. H = HIGH voltage level; L = LOW voltage level; X = don't care; = positive-going transition; = negative-going transition; Z = HIGH-impedance OFF-state; NC = no change; Q6S = the data in register stage 6 before the LOW to HIGH clock transition; Q7S = the data in register stage 7 before the HIGH to LOW clock transition.
CLOCK INPUT DATA INPUT STROBE INPUT OUTPUT ENABLE INPUT INTERNAL Q0S (FF 0) OUTPUT QP0 INTERNAL Q6S (FF 6) OUTPUT QP6 SERIAL OUTPUT QS1 SERIAL OUTPUT QS2
001aaf117
Z-state
Z-state
Fig 5.
Timing diagram
7. Limiting values
Table 4. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Voltages are referenced to VSS = 0 V (ground). Symbol VDD IIK VI IOK II/O IDD Tstg Tamb Ptot P
[1] [2]
Parameter supply voltage input clamping current input voltage output clamping current input/output current supply current storage temperature ambient temperature total power dissipation power dissipation
Conditions VI < 0.5 V or VI > VDD + 0.5 V VO < 0.5 V or VO > VDD + 0.5 V
Min -0.5 -0.5 -65 -40
Max +18 10 VDD + 0.5 10 10 50 +150 +125 750 500 100
Unit V mA V mA mA mA C C mW mW mW
DIP16 SO16 per output
[1] [2]
-
For DIP16 packages: above Tamb = 70 C, Ptot derates linearly with 12 mW/K. For SO16 packages: above Tamb = 70 C, Ptot derates linearly with 8 mW/K.
HEF4094B_4
(c) NXP B.V. 2008. All rights reserved.
Product data sheet
Rev. 04 -- 30 October 2008
4 of 17
NXP Semiconductors
HEF4094B
8-stage shift-and-store bus register
8. Recommended operating conditions
Table 5. Symbol VDD VI Tamb t/V Recommended operating conditions Parameter supply voltage input voltage ambient temperature input transition rise and fall rate in free air VDD = 5 V VDD = 10 V VDD = 15 V Conditions Min 3 0 -40 Typ Max 15 VDD +125 3.75 0.5 0.08 Unit V V C ns/V ns/V ns/V
9. Static characteristics
Table 6. Static characteristics VSS = 0 V; VI = VSS or VDD; unless otherwise specified. Symbol Parameter VIH HIGH-level input voltage Conditions |IO| < 1 A VDD 5V 10 V 15 V VIL LOW-level input voltage |IO| < 1 A 5V 10 V 15 V VOH HIGH-level output voltage |IO| < 1 A 5V 10 V 15 V VOL LOW-level output voltage |IO| < 1 A 5V 10 V 15 V IOH HIGH-level output current VO = 2.5 V VO = 4.6 V VO = 9.5 V VO = 13.5 V IOL LOW-level output current VO = 0.4 V VO = 0.5 V VO = 1.5 V IOZ OFF-state output current input leakage current QPn output is HIGH; VO = 15 V 5V 5V 10 V 15 V 5V 10 V 15 V 15 V Tamb = -40 C Tamb = +25 C Tamb = +85 C Tamb = +125 C Unit Min 3.5 7.0 11.0 4.95 9.95 14.95 -1.7 -0.64 -1.6 -4.2 0.64 1.6 4.2 Max 1.5 3.0 4.0 0.05 0.05 0.05 0.4 Min 3.5 7.0 11.0 4.95 9.95 14.95 -1.4 -0.5 -1.3 -3.4 0.5 1.3 3.4 Max 1.5 3.0 4.0 0.05 0.05 0.05 0.4 Min 3.5 7.0 11.0 4.95 9.95 14.95 -1.1 -0.36 -0.9 -2.4 0.36 0.9 2.4 Max 1.5 3.0 4.0 0.05 0.05 0.05 12 Min 3.5 7.0 11.0 4.95 9.95 14.95 -1.1 -0.36 -0.9 -2.4 0.36 0.9 2.4 Max 1.5 3.0 4.0 0.05 0.05 0.05 12 V V V V V V V V V V V V mA mA mA mA mA mA mA A
II
15 V
-
0.1
-
0.1
-
1.0
-
1.0
A
HEF4094B_4
(c) NXP B.V. 2008. All rights reserved.
Product data sheet
Rev. 04 -- 30 October 2008
5 of 17
NXP Semiconductors
HEF4094B
8-stage shift-and-store bus register
Table 6. Static characteristics ...continued VSS = 0 V; VI = VSS or VDD; unless otherwise specified. Symbol Parameter IDD supply current Conditions VDD Tamb = -40 C Tamb = +25 C Tamb = +85 C Tamb = +125 C Unit Min 5V all valid input combinations; 10 V IO = 0 A 15 V Max 5 10 20 Min Max 5 10 20 7.5 Min Max 150 300 600 Min Max 150 300 600 A A A pF
CI
input capacitance
10. Dynamic characteristics
Table 7. Dynamic characteristics VSS = 0 V; Tamb = 25 C; for test circuit see Figure 10; unless otherwise specified. Symbol tPHL Parameter HIGH to LOW propagation delay Conditions CP to QS1; see Figure 6 VDD 5V 10 V 15 V CP to QS2; see Figure 6 5V 10 V 15 V CP to QPn; see Figure 6 5V 10 V 15 V STR to QPn; see Figure 7 5V 10 V 15 V tPLH LOW to HIGH propagation delay, CP to QS1; see Figure 6 5V 10 V 15 V CP to QS2; see Figure 6 5V 10 V 15 V CP to QPn; see Figure 6 5V 10 V 15 V STR to QPn; see Figure 7 5V 10 V 15 V tt transition time 5V 10 V 15 V
[1] [1] [1]
Extrapolation formula 108 ns + (0.55 ns/pF) CL 54 ns + (0.23 ns/pF) CL 42 ns + (0.16 ns/pF) CL 78 ns + (0.55 ns/pF) CL 39 ns + (0.23 ns/pF) CL 32 ns + (0.16 ns/pF) CL 138 ns + (0.55 ns/pF) CL 64 ns + (0.23 ns/pF) CL 47 ns + (0.16 ns/pF) CL 83 ns + (0.55 ns/pF) CL 39 ns + (0.23 ns/pF) CL 27 ns + (0.16 ns/pF) CL 78 ns + (0.55 ns/pF) CL 39 ns + (0.23 ns/pF) CL 32 ns + (0.16 ns/pF) CL 78 ns + (0.55 ns/pF) CL 39 ns + (0.23 ns/pF) CL 32 ns + (0.16 ns/pF) CL 123 ns + (0.55 ns/pF) CL 59 ns + (0.23 ns/pF) CL 47 ns + (0.16 ns/pF) CL 73 ns + (0.55 ns/pF) CL 34 ns + (0.23 ns/pF) CL 27 ns + (0.16 ns/pF) CL 10 ns + (1.00 ns/pF) CL 9 ns + (0.42 ns/pF) CL 6 ns + (0.28 ns/pF) CL
Min -
Typ 135 65 50 105 50 40 165 75 55 110 50 35 105 50 40 105 50 40 150 70 55 100 45 35 60 30 20
Max 270 130 100 210 100 80 330 150 110 220 100 70 210 100 80 210 100 80 300 140 110 200 90 70 120 60 40
Unit ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns
HEF4094B_4
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Product data sheet
Rev. 04 -- 30 October 2008
6 of 17
NXP Semiconductors
HEF4094B
8-stage shift-and-store bus register
Table 7. Dynamic characteristics ...continued VSS = 0 V; Tamb = 25 C; for test circuit see Figure 10; unless otherwise specified. Symbol tPZH Parameter OFF-state to HIGH propagation delay Conditions OE to QPn; see Figure 8 VDD 5V 10 V 15 V tPZL OFF-state to LOW propagation delay OE to QPn; see Figure 8 5V 10 V 15 V tPHZ HIGH to OFF-state propagation delay OE to QPn; see Figure 8 5V 10 V 15 V tPLZ LOW to OFF-state propagation delay OE to QPn; see Figure 8 5V 10 V 15 V tsu set-up time D to CP; see Figure 9 5V 10 V 15 V th hold time D to CP; see Figure 9 5V 10 V 15 V tW pulse width minimum LOW 5 V clock pulse; 10 V see Figure 6 15 V minimum HIGH 5 V strobe pulse; 10 V see Figure 7 15 V fmax maximum frequency see Figure 6 5V 10 V 15 V
[1]
Extrapolation formula
Min 60 20 15 +5 20 20 60 30 24 40 30 24 5 11 14
Typ 40 25 20 40 25 20 75 40 30 80 40 30 30 10 5 -15 5 5 30 15 12 20 15 12 10 22 28
Max 80 50 40 80 50 40 150 80 60 160 80 60 -
Unit MHz MHz MHz MHz MHz MHz MHz MHz MHz MHz MHz MHz ns ns ns ns ns ns ns ns ns ns ns ns MHz MHz MHz
The typical values of the propagation delay and transition times are calculated from the extrapolation formulas shown (CL in pF).
Table 8. Dynamic power dissipation VSS = 0 V; tr = tf 20 ns; Tamb = 25 C. Symbol PD Parameter dynamic power dissipation VDD 5V 10 V 15 V Typical formula for PD (W) PD = 2100 x fi + (fo x CL) x PD = 9700 x fi + (fo x CL) x VDD2 VDD2
2
where: fi = input frequency in MHz, fo = output frequency in MHz, CL = output load capacitance in pF, VDD = supply voltage in V, (CL x fo) = sum of the outputs.
PD = 26000 x fi + (fo x CL) x VDD
HEF4094B_4
(c) NXP B.V. 2008. All rights reserved.
Product data sheet
Rev. 04 -- 30 October 2008
7 of 17
NXP Semiconductors
HEF4094B
8-stage shift-and-store bus register
11. Waveforms
1/fmax VI CP input GND tW tPLH VOH QPn, QS1 output VOL tPLH VOH QS2 output VOL VM
001aaf113
VM
tPHL VM
tPHL
Measurement points are given in Table 9. Logic levels: VOL and VOH are typical output voltage drops that occur with the output load.
Fig 6. Table 9. VDD
Clock to outputs propagation delays, and clock pulse width and maximum frequency Measurement points Input VM 0.5VDD Output VM 0.5VDD VX 0.1VDD VY 0.9VDD
Supply voltage 5 V to 15 V
VI STR input GND tW tPLH VOH QPn output VOL VM
001aaj058
VM
tPHL
Measurement points are given in Table 9. Logic levels: VOL and VOH are typical output voltage drops that occur with the output load.
Fig 7.
Strobe to output propagation delays, and strobe pulse width, set up and hold times
HEF4094B_4
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Product data sheet
Rev. 04 -- 30 October 2008
8 of 17
NXP Semiconductors
HEF4094B
8-stage shift-and-store bus register
VI OE input GND tPLZ VDD output LOW-to-OFF OFF-to-LOW VOL tPHZ VOH output HIGH-to-OFF OFF-to-HIGH GND outputs enabled VY VM VM tPZL
VM VX tPZH
outputs disabled
outputs enabled
001aai545
Measurement points are given in Table 9. Logic levels: VOL and VOH are typical output voltage drops that occur with the output load.
Fig 8.
3-state output enable and disable times for OE input
VI CP input GND t su th VI D input GND VM t su th VM
VOH QPn, QS1, QS2 output VOL
001aaf115
VM
Measurement points are given in Table 9. Logic levels: VOL and VOH are typical output voltage drops that occur with the output load.
Fig 9.
Data input data set up and hold times
HEF4094B_4
(c) NXP B.V. 2008. All rights reserved.
Product data sheet
Rev. 04 -- 30 October 2008
9 of 17
NXP Semiconductors
HEF4094B
8-stage shift-and-store bus register
VI input pulse VSS 10 % tr
90 %
tf VEXT VDD
RL
G
VI DUT
RT
VO
CL
001aag804
Test data is given in Table 10. Definitions for test circuit: DUT = Device Under Test. CL = load capacitance including jig and probe capacitance. RT = termination resistance should be equal to the output impedance Zo of the pulse generator.
Fig 10. Test circuit Table 10. VDD 5 V to 15 V Test data Input VI VSS or VDD tr, tf 20 ns VEXT tPHL, tPLH open tPHZ, tPZH VDD tPLZ, tPZL VSS Load CL 50 pF RL 1 k
Supply voltage
HEF4094B_4
(c) NXP B.V. 2008. All rights reserved.
Product data sheet
Rev. 04 -- 30 October 2008
10 of 17
NXP Semiconductors
HEF4094B
8-stage shift-and-store bus register
12. Application information
Some examples of applications for the HEF4094B are:
* Serial-to-parallel data conversion * Remote control holding register
DIGITALLY CONTROLLED EQUIPMENT (REQUIRES CONTINUOUS DIGITAL CONTROL) O0 D O7 DIGITALLY CONTROLLED EQUIPMENT DIGITALLY CONTROLLED EQUIPMENT
O0 D
O7
O0 D
O7
HEF4094B
STR CP
OS2
HEF4094B
STR CP
OS2
HEF4094B
STR CP
CONTROL AND SYNC CIRCUITRY
data
clock
001aae666
from remote control panel
Fig 11. Remote control holding register
HEF4094B_4
(c) NXP B.V. 2008. All rights reserved.
Product data sheet
Rev. 04 -- 30 October 2008
11 of 17
NXP Semiconductors
HEF4094B
8-stage shift-and-store bus register
13. Package outline
DIP16: plastic dual in-line package; 16 leads (300 mil) SOT38-4
D seating plane
ME
A2
A
L
A1
c Z e b1 b 16 9 b2 MH wM (e 1)
pin 1 index E
1
8
0
5 scale
10 mm
DIMENSIONS (inch dimensions are derived from the original mm dimensions) UNIT mm inches A max. 4.2 0.17 A1 min. 0.51 0.02 A2 max. 3.2 0.13 b 1.73 1.30 0.068 0.051 b1 0.53 0.38 0.021 0.015 b2 1.25 0.85 0.049 0.033 c 0.36 0.23 0.014 0.009 D (1) 19.50 18.55 0.77 0.73 E (1) 6.48 6.20 0.26 0.24 e 2.54 0.1 e1 7.62 0.3 L 3.60 3.05 0.14 0.12 ME 8.25 7.80 0.32 0.31 MH 10.0 8.3 0.39 0.33 w 0.254 0.01 Z (1) max. 0.76 0.03
Note 1. Plastic or metal protrusions of 0.25 mm (0.01 inch) maximum per side are not included. OUTLINE VERSION SOT38-4 REFERENCES IEC JEDEC JEITA EUROPEAN PROJECTION
ISSUE DATE 95-01-14 03-02-13
Fig 12. Package outline SOT38-4 (DIP16)
HEF4094B_4 (c) NXP B.V. 2008. All rights reserved.
Product data sheet
Rev. 04 -- 30 October 2008
12 of 17
NXP Semiconductors
HEF4094B
8-stage shift-and-store bus register
SO16: plastic small outline package; 16 leads; body width 3.9 mm
SOT109-1
D
E
A X
c y HE vMA
Z 16 9
Q A2 pin 1 index Lp 1 e bp 8 wM L detail X A1 (A 3) A
0
2.5 scale
5 mm
DIMENSIONS (inch dimensions are derived from the original mm dimensions) UNIT mm inches A max. 1.75 A1 0.25 0.10 A2 1.45 1.25 A3 0.25 0.01 bp 0.49 0.36 c 0.25 0.19 D (1) 10.0 9.8 E (1) 4.0 3.8 0.16 0.15 e 1.27 0.05 HE 6.2 5.8 L 1.05 Lp 1.0 0.4 0.039 0.016 Q 0.7 0.6 0.028 0.020 v 0.25 0.01 w 0.25 0.01 y 0.1 Z (1) 0.7 0.3
0.010 0.057 0.069 0.004 0.049
0.019 0.0100 0.39 0.014 0.0075 0.38
0.244 0.041 0.228
0.028 0.004 0.012
8 o 0
o
Note 1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included. OUTLINE VERSION SOT109-1 REFERENCES IEC 076E07 JEDEC MS-012 JEITA EUROPEAN PROJECTION
ISSUE DATE 99-12-27 03-02-19
Fig 13. Package outline SOT109-1 (SO16)
HEF4094B_4 (c) NXP B.V. 2008. All rights reserved.
Product data sheet
Rev. 04 -- 30 October 2008
13 of 17
NXP Semiconductors
HEF4094B
8-stage shift-and-store bus register
SSOP16: plastic shrink small outline package; 16 leads; body width 5.3 mm
SOT338-1
D
E
A X
c y HE vM A
Z 16 9
Q A2 A1 pin 1 index Lp L 1 bp 8 wM detail X (A 3) A
e
0
2.5 scale
5 mm
DIMENSIONS (mm are the original dimensions) UNIT mm A max. 2 A1 0.21 0.05 A2 1.80 1.65 A3 0.25 bp 0.38 0.25 c 0.20 0.09 D (1) 6.4 6.0 E (1) 5.4 5.2 e 0.65 HE 7.9 7.6 L 1.25 Lp 1.03 0.63 Q 0.9 0.7 v 0.2 w 0.13 y 0.1 Z (1) 1.00 0.55 8 o 0
o
Note 1. Plastic or metal protrusions of 0.25 mm maximum per side are not included. OUTLINE VERSION SOT338-1 REFERENCES IEC JEDEC MO-150 JEITA EUROPEAN PROJECTION
ISSUE DATE 99-12-27 03-02-19
Fig 14. Package outline SOT338-1 (SSOP16)
HEF4094B_4 (c) NXP B.V. 2008. All rights reserved.
Product data sheet
Rev. 04 -- 30 October 2008
14 of 17
NXP Semiconductors
HEF4094B
8-stage shift-and-store bus register
14. Abbreviations
Table 11. Acronym DUT ESD HBM MM Abbreviations Description Device Under Test ElectroStatic Discharge Human Body Model Machine Model
15. Revision history
Table 12. Revision history Release date 20081030 Data sheet status Product data sheet Change notice Supersedes HEF4094B_CNV_3 Document ID HEF4094B_4 Modifications:
* * * * * * * *
The format of this data sheet has been redesigned to comply with the new identity guidelines of NXP Semiconductors. Legal texts have been adapted to the new company name where appropriate. Temperature range maximum value increased from 85 C to 125 C. Section 2 "Features" added. Package version SOT38-1 changed to SOT38-4 in Section 3, and Figure 12. Package SOT74 removed from Section 3. Package SOT338-1 added to Section 3, and Figure 14. Section 7 "Limiting values" and Section 9 "Static characteristics" added, taken from the HE4000B Family Specifications data sheet. Section 9 "Static characteristics" IOH, IOL, II and IDD values updated. Section 14 "Abbreviations" added. Product specification Product specification HEF4094B_CNV_2 -
HEF4094B_CNV_3 HEF4094B_CNV_2
19950101 19950101
HEF4094B_4
(c) NXP B.V. 2008. All rights reserved.
Product data sheet
Rev. 04 -- 30 October 2008
15 of 17
NXP Semiconductors
HEF4094B
8-stage shift-and-store bus register
16. Legal information
16.1 Data sheet status
Document status[1][2] Objective [short] data sheet Preliminary [short] data sheet Product [short] data sheet
[1] [2] [3]
Product status[3] Development Qualification Production
Definition This document contains data from the objective specification for product development. This document contains data from the preliminary specification. This document contains the product specification.
Please consult the most recently issued document before initiating or completing a design. The term `short data sheet' is explained in section "Definitions". The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com.
16.2 Definitions
Draft -- The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Short data sheet -- A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail.
malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer's own risk. Applications -- Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Limiting values -- Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) may cause permanent damage to the device. Limiting values are stress ratings only and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability. Terms and conditions of sale -- NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, including those pertaining to warranty, intellectual property rights infringement and limitation of liability, unless explicitly otherwise agreed to in writing by NXP Semiconductors. In case of any inconsistency or conflict between information in this document and such terms and conditions, the latter will prevail. No offer to sell or license -- Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
16.3 Disclaimers
General -- Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. Right to make changes -- NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof. Suitability for use -- NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or
16.4 Trademarks
Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners.
17. Contact information
For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: salesaddresses@nxp.com
HEF4094B_4
(c) NXP B.V. 2008. All rights reserved.
Product data sheet
Rev. 04 -- 30 October 2008
16 of 17
NXP Semiconductors
HEF4094B
8-stage shift-and-store bus register
18. Contents
1 2 3 4 5 5.1 5.2 6 7 8 9 10 11 12 13 14 15 16 16.1 16.2 16.3 16.4 17 18 General description . . . . . . . . . . . . . . . . . . . . . . 1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Ordering information . . . . . . . . . . . . . . . . . . . . . 1 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2 Pinning information . . . . . . . . . . . . . . . . . . . . . . 3 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 3 Functional description . . . . . . . . . . . . . . . . . . . 3 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 4 Recommended operating conditions. . . . . . . . 5 Static characteristics. . . . . . . . . . . . . . . . . . . . . 5 Dynamic characteristics . . . . . . . . . . . . . . . . . . 6 Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 Application information. . . . . . . . . . . . . . . . . . 11 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 12 Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Revision history . . . . . . . . . . . . . . . . . . . . . . . . 15 Legal information. . . . . . . . . . . . . . . . . . . . . . . 16 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 16 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Contact information. . . . . . . . . . . . . . . . . . . . . 16 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Please be aware that important notices concerning this document and the product(s) described herein, have been included in section `Legal information'.
(c) NXP B.V. 2008.
All rights reserved.
For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: salesaddresses@nxp.com Date of release: 30 October 2008 Document identifier: HEF4094B_4


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